1.

国際会議録
国際会議録
1. Color-coded grating 3D profile measurement and its application
Liu,W. ; Wang,Z. ; Mu,G. ; Fang,Z.
出版情報: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.98-101,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4221
2.

国際会議録
国際会議録
2. Novel surface profile measurement with color-coded grating projection
Liu,W. ; Wang,Z. ; Mu,G. ; Fang,Z.
出版情報: Photonic Systems and Applications in Defense and Manufacturing.  pp.374-381,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3898