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Effects of processing conditions on PbGeTe film performance

著者名:
Zhang,S. ( Shanghai Institute of Technical Physics (China) )
Cheng,C. ( Shanghai Nicera Sensor Co.,Ltd. (China) )
Ling,J. ( Shanghai Nicera Sensor Co.,Ltd. (China) )
Fan,B. ( Shanghai Institute of Technical Physics (China) )
Zou,Z. ( Shanghai Institute of Testing Technology (China) )
Wang,Z. ( Shanghai Institute of Testing Technology (China) )
Zhang,J. ( Shanghai Institute of Testing Technology (China) )
Shi,T. ( Shanghai Institute of Mrtallurgy (China) )
Wang,G. ( Shanghai Institute of Mrtallurgy (China) )
さらに 4 件
掲載資料名:
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3175
発行年:
1998
開始ページ:
429
終了ページ:
432
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426734 [0819426733]
言語:
英語
請求記号:
P63600/3175
資料種別:
国際会議録

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