1.

国際会議録
国際会議録
1. Analysis of Dislocation Behavior in Low Dislocation Density, PVT-Grown, Four-Inch Silicon Carbide Single Crystals
M. Dudley ; S. Byrappa ; H. Wang ; F. Wu ; Y. Zhang ; B. Raghothamachar ; G. Choi ; E.K. Sanchez ; D. Hansen ; R. Drachev ; M.J. Loboda
出版情報: Silicon Carbide 2010--materials, processing and devices : symposium held April 5-9, 2010, San Francisco, California.  pp.29-36,  2010.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 1246
2.

国際会議録
国際会議録
2. Far-infrared Fizeau interferometer for large aspheric mirror
Y. Wu ; Y. Zhang ; F. Wu ; Q. Chen ; L. Li
出版情報: Interferometry XIV : applications : 13-14 August 2008, San Diego, California, USA.  pp.70640S-1-70640S-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7064
3.

国際会議録
国際会議録
3. Correlation between crystalline qualities and resistive switching effects of La0.7Sr0.3MnO3films
F. Wu ; X. Li ; W. Yu ; Y. Zhang ; X. Cao
出版情報: Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China.  pp.69841J-1-69841J-5,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6984
4.

国際会議録
国際会議録
4. Structures and optical properties of indium doped SrTiO3 thin films by oxygen plasmaassisted putsed laser deposition
Y. Zhang ; X. Li ; W. Yu ; X. Gao ; F. Wu
出版情報: Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China.  pp.69841H-1-69841H-5,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6984