1.

国際会議録
国際会議録
1. Two-channel fluorescence lifetime microscope with two colour laser excitation, single-molecule sensitivity, and submicrometer resolution
Koberling, F. ; Wahl, M. ; Patting, M. ; Rahn, H.-J. ; Kapusta, P. ; Erdmann, R.
出版情報: Novel optical instrumentation for biomedical applications : 24-25 June 2003, Munich, Germany.  pp.181-192,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5143
2.

国際会議録
国際会議録
2. Fluorescence lifetime imaging system with nm-resolution and single-molecule sensitivity
Wahl, M. ; Rahn, H.-J. ; Ortmann, U. ; Erdmann, R. ; Boehmer, M. ; Enderlein, J.
出版情報: Methods for ultrasensitive detection ll : 21-22 January 2002, San Jose, USA.  pp.104-111,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4634
3.

国際会議録
国際会議録
3. Amplified picosecond diode lasers for diffuse optical imaging and spectroscopy of tissue
Erdmann, R. ; Langkopf, M. ; Lauritsen, K. ; Bulter, A. ; Wahl, M. ; Wabnitz, H. ; Liebert, A. ; Moller, M. ; Schmitt, T.
出版情報: Optical Tomography and Spectroscopy of Tissue VI.  pp.43-50,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5693
4.

国際会議録
国際会議録
4. Time-resolved laser scanning microscopy with FLIM and advanced FCS capability
Kramer, B. ; Koberling, F. ; Ortmann, U. ; Wahl, M. ; Kapusta, P. ; Bulter, A. ; Erdmann, R.
出版情報: Multiphoton Microscopy in the Biomedical Sciences V.  pp.138-143,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5700
5.

国際会議録
国際会議録
5. Compact TCSPC upgrade package for laser scanning microscopes based on 375- to 470-nm picosecond diode lasers
Ortmann, U. ; Dertinger, T. ; Wahl, M. ; Patting, M. ; Erdmann, R.
出版情報: Optical Diagnostics and Sensing IV.  pp.179-186,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5325