Wahi, M. ; Ortmann, U. ; Lauritsen, K. ; Erdmann, R.
出版情報:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.171-178, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering