THE NUCLEATION AND PROPAGATION OF MISFIT DISLOCATIONS NEAR THE CRITICAL THICKNESS IN Ge-Si STRAINED EPILAYERS
- 著者名:
Kvam, E. P. Eaglesham, D. J. Maher, D. M. Humphreys, C. J. Bean, J. C. Green, G. S. Tanner, B. K. - 掲載資料名:
- Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 104
- 発行年:
- 1988
- 開始ページ:
- 623
- 終了ページ:
- 628
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837722 [0931837723]
- 言語:
- 英語
- 請求記号:
- M23500/104
- 資料種別:
- 国際会議録
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