1.

国際会議録
国際会議録
1. 60Co gamma-irradiation-induced defects in MOCVD η-GaN
Umana-Membreno, G.A. ; Dell, J.M. ; Parish, G. ; Faraone, L. ; Mishra, U.K.
出版情報: Design, characterization, and packaging for MEMS and microelectronics II : 17-19 December, 2001, Adelaide, Australia.  pp.220-227,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4593
2.

国際会議録
国際会議録
2. Magnetoresistance characteristics of gamma-irradiated Al0.35Ga0.65N/GaN HFETs
Umana-Membreno, G.A. ; Dell, J.M. ; Parish, G. ; Nener, B.D. ; Faraone, L. ; Ventury, R. ; Mishra, U.K.
出版情報: Microelectronics: Design, Technology, and Packaging.  pp.152-162,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5274