1.

国際会議録
国際会議録
1. High Temperature Silicon Carbide CMOS Integrated Circuits
D.T. Clark ; E.P. Ramsay ; A.E. Murphy ; D.A. Smith ; R.F. Thompson
出版情報: Silicon Carbide and Related Materials 2010 : Selected, peer reviewed papers from the 8th European Conference on Silicon Carbide and Related Materials (ECSCRM 2010), held in Oslo (Sundvolden Conference Centre), Norway, August 29th - September 2nd.  pp.726-729,  2011.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 679-680
2.

国際会議録
国際会議録
2. Smart materials, surfaces transforms, and interfaces: the commensurate engineering dimension
D.T. Clark
出版情報: Second European Conference on Smart Structures and Materials : held at the Glasgow Hilton, Glasgow, Scotland, 12-14 October 1994.  pp.2-10,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2361
3.

国際会議録
国際会議録
3. Electrical Stability Impact of Gate Oxide in Channel Implanted SiC NMOS and PMOS Transistors
M.I. Idris ; M.H. Weng ; H.K. Chan ; A.E. Murphy ; D.A. Smith ; R.A.R. Young ; E.P. Ramsay ; D.T. Clark ; N.G. Wright ; A.B. Horsfall
出版情報: Silicon Carbide and Related Materials 2016.  pp.513-516,  2017.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 897