Depas, M. ; Heyns, M.M. ; Nigam, T. ; Kenis, K. ; Sprey, H. ; Wilhelm, R. ; Crossley, A. ; Sofield, C.J. ; Graef, D.
出版情報:
The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface. pp.352-366, 1996. Pennington, NJ. Electrochemical Society
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.1-10, 2005. Dordrecht. Kluwer Academic Publishers
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry