Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals
- 著者名:
- Chung,H. ( SUNY/Stony Brook )
- Raghothamachar,B.
- Dudley,M.
- Larson,D.J.,Jr.
- 掲載資料名:
- Space processing of materials : 4-5 August 1996, Denver, Colorado
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2809
- 発行年:
- 1996
- 開始ページ:
- 45
- 終了ページ:
- 56
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819421975 [0819421979]
- 言語:
- 英語
- 請求記号:
- P63600/2809
- 資料種別:
- 国際会議録
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