Nanomaterials by severe plastic deformation : NanoSPD3 : proceedings of the 3rd Conference on Nanomaterials by Severe Plastic Deformation held at Fukuoka, Japan on September 22-26, 2005. pp.823-828, 2006. Uetikon-Zuerich. Trans Tech Publications
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63521H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Nanomaterials by severe plastic deformation : NanoSPD3 : proceedings of the 3rd Conference on Nanomaterials by Severe Plastic Deformation held at Fukuoka, Japan on September 22-26, 2005. pp.901-906, 2006. Uetikon-Zuerich. Trans Tech Publications
Advanced signal processing algorithms, architectures, and implementations XII : 9-11 July 2002, Seattle, Washington, USA. pp.456-465, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kim, M. ; Park, S. U. ; Kim, D. Y. ; Kwon, S. C. ; Choi, Y.
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3823-3826, 2005. Uetikon-Zuerich. Trans Tech Publications
Choi, M. Y. ; Choi, Y. ; Choe, J. I. ; Kim, M. ; Kwon, S. C.
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.4005-4008, 2005. Uetikon-Zuerich. Trans Tech Publications
Choi, Y. ; Choi, M. Y. ; Hahn, Y. S. ; Kim, M. ; Kwon, S. C.
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3815-3818, 2005. Uetikon-Zuerich. Trans Tech Publications
Phase transformation kinetics in thin films : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A.. pp.121-130, 1992. Pittsburgh, Pa.. Materials Research Society
Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA. pp.521-530, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kweon, G. ; Kim, K. ; Choi, Y. ; Kim, G. ; Kim, H. ; Yang, S.
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Military remote sensing : 27-28 October 2004, London, United Kingdom. pp.29-42, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Multiscale phenomena in materials - experiments and modeling : sympoisum held November 30-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.445-, 2000. Warrendale, Pa.. MRS-Materials Research Society
OFS-13 : 13th International Conference on Optical Fiber Sensors & Workshop on Device and System Technology toward Future Optical Fiber Communication and Sensing : April 12-16, 1999, Kyongju Hyundai Hotel, Kyongju, Korea. pp.430-433, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Kang, H. -J. ; Choi, Y. ; Kim, K. ; Park, I. -C. ; Kim, J. -W. ; Lee, E. -H. ; Gahang, G. -S.
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Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA. pp.448-456, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Jeong, H. J. ; Lim, S.C. ; Lee, J. Y. ; Jung, K. T. ; Choi, Y. ; Lee, Y. H.
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EUROCVD-15, fifteenth European Conference on Chemical Vapor Deposition : proceedings of the international symposium. pp.364-371, 2005. Pennington, NJ. Electrochemical Society
Tajima, K. ; Choi, Y. ; Shin, W. ; Izu, N. ; Matsubara, I. ; Murayama, N. (National Institute of Advanced Industrial Science and Technology)
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Chemical sensors VI : chemical and biological sensors and analytical methods : proceedings of the international symposium. pp.117-121, 2004. Pennington,NJ. Electrochemical Society
Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001. pp.139-139, 2001. Amsterdam. Elsevier
Metrology, Inspection, and Process Control for Microlithography XX. pp.61522H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Choi, Y. ; Kim, W.-J. ; Shin, K.-J. ; Kim, J.-G ; Hong, W.-W
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Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems. pp.61741Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems. pp.61742R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Choi, Y. ; Chang, H. ; Lee, J.D. ; Kim, E. ; No, K.
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Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.455-461, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ha, T.-J. ; Lee, Y.-M. ; Choi, B.K. ; Choi, Y. ; Han, O.
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Photomask and Next-Generation Lithography Mask Technology XI. pp.118-127, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photomask and Next-Generation Lithography Mask Technology XIII. pp.62832F-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering