1.

国際会議録
国際会議録
1. Optically Detected Cyclotron Resonance for Defect Characterization
Godlewski,M. ; Chen,W.M. ; Monemar,B.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1353-1358,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
2.

国際会議録
国際会議録
2. Optically Detected Wagnetic Resotrance Studies of Non-Radiative Recombination Centres in 6H SiC
Son,N.T. ; Wagner,Mt. ; Sorman,E. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.599-602,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
3.

国際会議録
国際会議録
3. Evaluation of bridge pavement samples using an optical fiber sensor system
Huang,S.L. ; Zhao,T.C. ; Chen,W.M.
出版情報: Smart materials, structures, and integrated systems : 11-13 December 1997, Adelaide, Australia.  pp.347-352,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3241
4.

国際会議録
国際会議録
4. Fiber optic corrosion sensor fabricated by electrochemical method
Li,X.M. ; Chen,W.M. ; Huang,Z.Q. ; Huang,S.L. ; Bennett,K.D.
出版情報: Smart structures and materials 1998 : Sensory phenomena and measurement instrumentation for smart structures and materials : 2-4 March 1998, San Diego, California.  pp.126-133,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3330
5.

国際会議録
国際会議録
5. A new defect observed in annealed highly phosphorus doped electron-irradiated silicon
Lindstrom,J.L. ; Svensson,B.G. ; Chen,W.M.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.333-338,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
6.

国際会議録
国際会議録
6. ODMR and electron spin echo studies on the non-radiative triplet state of the(V-O)0 defect in silicon
Frens,A.M. ; Schmidt,J. ; Chen,W.M. ; Monemar,B.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.357-362,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
7.

国際会議録
国際会議録
7. Monitoring the corrosion of steel in reinforced concrete using optical waveguide methods
Li,X.M. ; Chen,W.M. ; Zhu,Y. ; Huang,S.L. ; Bennett,K.D.
出版情報: Smart structures and materials 2000 : Sensory phenomena and measurement instrumentation for smart structures and materials : 6-8 March 2000, Newport Beach, USA.  pp.172-179,  2000.  Bellingham.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3986
8.

国際会議録
国際会議録
8. Optically detected magnetic resonance of semiconductor thin films and layered structures
Chen,W.M.
出版情報: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.44-49,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4086
9.

国際会議録
国際会議録
9. A deep photoluminescence band in 4H SiC related to the silicon vacancy
Sorman,E. ; Son,N.T. ; Chen,W.M. ; Hallin,C. ; Lindstrom,J.L. ; Janzen,E.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.685-690,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
10.

国際会議録
国際会議録
10. Optically Detected Magnetic Resonance Studies of Bound Exciton Triplets for Complex Defects in GaP
Monemar,B. ; Chen,W.M. ; Godlewski,M.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.769-774,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
11.

国際会議録
国際会議録
11. A Novel PGa-Antisite Related Deep Isoelectronic Complex Defect in Gold- and Lithium-Doped GaP
Chen,W.M. ; Monemar,B. ; Pistol,M.E.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.899-904,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
12.

国際会議録
国際会議録
12. The role of non-radiative defects in thermal quenching of luminescence in SiGe/Si structures grown by molecular beam epitaxy
Buyanova,I.A. ; Chen,W.M. ; Pozina,G. ; Monemar,B. ; Ni,W.X. ; Hansson,G.V.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.139-144,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
13.

国際会議録
国際会議録
13. Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon
Chen,W.M. ; Monemar,B. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.(invited)
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1345-1352,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
14.

国際会議録
国際会議録
14. Chromium in 4H and 6H SiC:Photcluminescence and Zeeman Studies
Son,N.T. ; Ellison,A. ; MacMillan,M.F. ; Kordina,O. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.603-606,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
15.

国際会議録
国際会議録
15. Intrinsic modulation doping in InP-based heterostructures.(Invited)
Chen,W.M. ; Buyanova,I.A. ; Bi,W.G. ; Tu,C.W.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.805-812,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
16.

国際会議録
国際会議録
16. The Configurational Change of a Metastable S-Cu Defect in Silicon
Chen,W.M. ; Janzen,E. ; Monemar,B. ; Henry,A. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1179-1184,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
17.

国際会議録
国際会議録
17. Electronic Structure of PIn Antisite in InP
Chen,W.M. ; Dreszer,P. ; Leon,R. ; Sorman,E.R.Weber E. ; Monemar,B. ; Liang,B.W. ; Tu,C.W.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.211-216,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
18.

国際会議録
国際会議録
18. Properties of Resonant Localized Donor Level in Low-Temperature-Grown InP
Dreszer,P. ; Chen,W.M. ; Wasik,D. ; Walukiewicz,W. ; Liang,B.W. ; Tu,C.W. ; Weber,E.R.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1081-1086,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
19.

国際会議録
国際会議録
19. A Metastable Selenium-Related Center in Silicon
Henry,A. ; Sorman,E. ; Andersson,S. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.159-164,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
20.

国際会議録
国際会議録
20. Observation of Rapid Direct Charge Transfer between Deep Defects in Silicon
Frens,A.M. ; Bennebroek,M.T. ; Zakrzewski,A. ; Schmidt,J. ; Chen,W.M. ; Janzen,E. ; Lindstrom,J.L. ; Monemar,B.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1371-1374,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
21.

国際会議録
国際会議録
21. The Neutral Silicon Vacancy in 6H and 4H SiC
Sorman,E. ; Chen,W.M. ; Son,N.T. ; Hallin,C. ; Lindstrom,J.L. ; Monemar,B. ; Janzen,E.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.473-476,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
22.

国際会議録
国際会議録
22. Important Nonradiative Grown-In Defects in MBE-Grown Si and SiGe/Si Heterostructures
Chen,W.M. ; Buyanova,I.A. ; Henry,A. ; Ni,W.-X. ; Hansson,G.V. ; Monemar,B.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.473-478,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
23.

国際会議録
国際会議録
23. Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers
Buyanova,I.A. ; Chen,W.M. ; Henry,A. ; Ni,W.X. ; Hansson,G.V. ; Monemar,B.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.479-484,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
24.

国際会議録
国際会議録
24. Magnetic resonance from a metastable sulfur-pair-related complex defect in silicon
Chen,W.M. ; Singh,M. ; Henry,A. ; Janzen,E. ; Monemar,B. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J. ; Reeson,K.J. ; Gwilliam,R.M.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.251-256,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
25.

国際会議録
国際会議録
25. Growth of Yb-doped fluorapatate crystal and study of its defects and spectroscopy performance
Yang,P. ; Deng,P. ; Xu,J. ; Chai,Y. ; Chen,W.M.
出版情報: Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China.  pp.182-188,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3556
26.

国際会議録
国際会議録
26. Optical sensors for smart civil infrastructures (Invited Paper)
Huang,S.L. ; Chen,W.M. ; Bennett,K.D.
出版情報: Optical and Fiber Optic Sensor Systems.  pp.266-271,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3555
27.

国際会議録
国際会議録
27. Laser technique for measuring three-dimensional interstory drift
Chen,W.M. ; Bennett.K.D. ; Feng,J. ; Wang,Y.P. ; Huang,S.L.
出版情報: Optical and Fiber Optic Sensor Systems.  pp.305-310,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3555