1.

国際会議録
国際会議録
1. Optically Detected Cyclotron Resonance for Defect Characterization
Godlewski,M. ; Chen,W.M. ; Monemar,B.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1353-1358,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
2.

国際会議録
国際会議録
2. Optically Detected Wagnetic Resotrance Studies of Non-Radiative Recombination Centres in 6H SiC
Son,N.T. ; Wagner,Mt. ; Sorman,E. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.599-602,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
3.

国際会議録
国際会議録
3. ODMR and electron spin echo studies on the non-radiative triplet state of the(V-O)0 defect in silicon
Frens,A.M. ; Schmidt,J. ; Chen,W.M. ; Monemar,B.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.357-362,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
4.

国際会議録
国際会議録
4. Optically Detected Magnetic Resonance Studies of Bound Exciton Triplets for Complex Defects in GaP
Monemar,B. ; Chen,W.M. ; Godlewski,M.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.769-774,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
5.

国際会議録
国際会議録
5. A Novel PGa-Antisite Related Deep Isoelectronic Complex Defect in Gold- and Lithium-Doped GaP
Chen,W.M. ; Monemar,B. ; Pistol,M.E.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.899-904,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
6.

国際会議録
国際会議録
6. The role of non-radiative defects in thermal quenching of luminescence in SiGe/Si structures grown by molecular beam epitaxy
Buyanova,I.A. ; Chen,W.M. ; Pozina,G. ; Monemar,B. ; Ni,W.X. ; Hansson,G.V.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.139-144,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
7.

国際会議録
国際会議録
7. Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon
Chen,W.M. ; Monemar,B. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.(invited)
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1345-1352,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
8.

国際会議録
国際会議録
8. Chromium in 4H and 6H SiC:Photcluminescence and Zeeman Studies
Son,N.T. ; Ellison,A. ; MacMillan,M.F. ; Kordina,O. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.603-606,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
9.

国際会議録
国際会議録
9. The Configurational Change of a Metastable S-Cu Defect in Silicon
Chen,W.M. ; Janzen,E. ; Monemar,B. ; Henry,A. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1179-1184,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
10.

国際会議録
国際会議録
10. Electronic Structure of PIn Antisite in InP
Chen,W.M. ; Dreszer,P. ; Leon,R. ; Sorman,E.R.Weber E. ; Monemar,B. ; Liang,B.W. ; Tu,C.W.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.211-216,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147