Novel method to calculate the probability of silicon damage of DRAM based on the process control capability
- 著者名:
- King,M. ( Taiwan Semiconductor Manufacturing Co.,Ltd. )
- Leu,J.-C. ( Taiwan Semiconductor Manufacturing Co.,Ltd. )
- Chen,S.-S. ( Taiwan Semiconductor Manufacturing Co.,Ltd. )
- Chao,Y.-C. ( Taiwan Semiconductor Manufacturing Co.,Ltd. )
- 掲載資料名:
- In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3215
- 発行年:
- 1997
- 開始ページ:
- 158
- 終了ページ:
- 166
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426475 [0819426474]
- 言語:
- 英語
- 請求記号:
- P63600/3215
- 資料種別:
- 国際会議録
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