Blank Cover Image

Contemporary issues for experimental design in assessment of medical imaging and computer-assist systems

著者名:
  • Wagner, R.F. ( FDA Ctr. for Devices and Radiological Health (USA) )
  • Beiden, S.V. ( FDA Ctr. for Devices and Radiological Health (USA) )
  • Campbell, G. ( FDA Ctr. for Devices and Radiological Health (USA) )
  • Metz, C.E. ( Univ. of Chicago (USA) )
  • Sacks, W.M. ( FDA Ctr. for Devices and Radiological Health (USA) )
掲載資料名:
Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5034
発行年:
2003
開始ページ:
213
終了ページ:
224
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819448354 [0819448354]
言語:
英語
請求記号:
P63600/5034
資料種別:
国際会議録

類似資料:

Beiden,S.V., Wagner,R.F., Campbell,G., Metz,C.E., Jiang,Y., Chan,H.-P.

SPIE-The International Society for Optical Engineering

Wagner, R. F.

SPIE - The International Society of Optical Engineering

Beiden,S.V., Wagner,R.F., Campbell,G., Metz,C.E., Chan,H.-P., Nishikawa,R.M., Schnall,M.D., Jiang,Y.

SPIE-The International Society for Optical Engineering

Beiden, S.V., Maloof, M.A., Wagner, R.F.

SPIE-The International Society for Optical Engineering

Wagner,R.F., Beiden,S.V., Campbell,G.

SPIE-The International Society for Optical Engineering

Jiang,Y., Metz,C.E.

SPIE-The International Society for Optical Engineering

Beiden, S.V., Wagner, R.F., Doi, K., Nishikawa, R.M., Freedman, M.T., Lo, S.-C.B., Xu, X.-W.

SPIE-The International Society for Optical Engineering

10 国際会議録 Evaluation of medical images

Metz E. C.

Springr-Verlag

Beiden,S.V., Campbell,G., Meier,K.L., Wagner,R.F.

SPIE - The International Society for Optical Engineering

Hoo,K.S.,Jr., Wong,S.T.C., Laxer,K.D., Knowlton,R.C., Ching,W.

SPIE - The International Society for Optical Engineering

Wagner, R.F., Beam, C.A., Beiden, S.V.

SPIE-The International Society for Optical Engineering

Jiang, Y., Sacks, W., Metz, C. E.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12