Extending focus of optical microscopy and application

Extending focus of optical microscopy and application

著者名:

Wang, J. ( Tianjin Univ. (China) )
Liu, W. ( Tianjin Univ. (China) )
Cai, H. ( Tianjin Univ. (China) )
Liu, M. ( Tianjin Univ. (China) )
Li, R. ( Tianjin Univ. (China) )

掲載資料名:

Third International Symposium on Multispectral Image Processing and Pattern Recognition

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5286

発行年:

2003

開始ページ:

654

終了ページ:

657

総ページ数:

4

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451811 [0819451819]

言語:

英語

請求記号:

P63600/5286.2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013631
シリーズID:	PA00000029
会議名:	International Symposium on Multispectral Image Processing and Pattern Recognition
回次:	2003 : 3rd
会議開催地:	Beijing, China
会議開催年:	2003.10.20-2003.10.22

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