International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland. pp.293-306, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA. pp.489-497, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Applications of photonic technology 3 : closing the gap between theory, development, and application. pp.842-847, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland. pp.254-259, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared detectors for remote sensing : physics, materials, and devices : 8-9 August 1996, Denver, Colorado. pp.90-97, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Applications of photonic technology 3 : closing the gap between theory, development, and application. pp.214-218, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Applications of photonic technology 3 : closing the gap between theory, development, and application. pp.457-461, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii. Part 1 pp.39-47, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Laser applications in microelectronic and optoelectronic manufacturing IV : 25-27 January 1999, San Jose, California. pp.191-197, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California. pp.280-286, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California. pp.167-172, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices II : 12-14 February 1997, San Jose, California. pp.153-160, 1997. Bellingham, WA. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.130-140, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.371-378, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Infrared Detectors and Focal Plane Arrays IV : 10-11 April 1996, Orlando, Florida. pp.134-141, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.154-159, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Quantum well and superlattice physics VI : 29-30 January 1996, San Jose, California. pp.148-156, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.155-162, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Laser Applications in Microelectronic and Optoelectronic Manufacturing II. pp.113-118, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared. pp.282-288, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Laser Applications in Microelectronic and Optoelectronic Manufacturing III. pp.53-60, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II. pp.318-324, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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