Blackshire, J.L. ; Hoffmann, J. ; Kropas-Hughes, C.V. ; Tansel, I.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.93-103, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Malas, J.C. ; Kropas-Hughes, C.V. ; Blackshire, J.L. ; Moran, T. ; Peeler, D. ; Frazier, W.G. ; Parker, D.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.28-36, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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