1.

国際会議録
国際会議録
1. Conspicuity and identifiability: efficient calibration tools for synthetic imagery
Toet, A. ; Hogervorst, M.A. ; Bijl, P.
出版情報: Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA.  pp.1-12,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5431
2.

国際会議録
国際会議録
2. On the relationship between human search strategies, conspicuity, and search performance
Hogervorst, M. A. ; Bijl, P. ; Toet, A.
出版情報: Infrared imaging systems : design, analysis, modeling, and testing XVI : 30 March-1 April 2005, Orlando, Florida, USA.  pp.240-251,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5784
3.

国際会議録
国際会議録
3. Human search with a limited field of view: the effect of scanning parameters and scene content
Hogervorst, M.A. ; Bijl, P. ; Toet, A. ; Valeton, J.M.
出版情報: Targets and backgrounds VIII : characterization and representation : 1-3 April 2002, Orland, USA.  pp.83-94,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4718
4.

国際会議録
国際会議録
4. Identifiability: a fast way to measure identification performance
Hogervorst, M.A. ; Toet, A. ; Bijl, P. ; Miller, B.
出版情報: Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA.  pp.96-103,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5407
5.

国際会議録
国際会議録
5. Identification of military targets and simple laboratory test patterns in band-limited noise
Bijl, P. ; Hogervorst, M.A. ; Toet, A.
出版情報: Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA.  pp.104-115,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5407