Defect creation mechanisms due to hot-carriers in 0.15 μm SIMOX MOSFETs
- 著者名:
- 掲載資料名:
- Progress in SOI structures and devices operating at extreme conditions
- シリーズ名:
- NATO science series. Series 2, Mathematics, physics and chemistry
- シリーズ巻号:
- 58
- 発行年:
- 2002
- 開始ページ:
- 263
- 終了ページ:
- 268
- 総ページ数:
- 6
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISBN:
- 9781402005756 [140200575X]
- 言語:
- 英語
- 請求記号:
- N17050/58
- 資料種別:
- 国際会議録
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