1.

国際会議録
国際会議録
1. Accurate high reflectivity measurement based on a novel optical feedback cavity ring-down technique
Y. Gong ; B. Li ; Y. Han ; M. Liu
出版情報: Laser-Induced Damage in Optical Materials: 2008.  pp.71320U-1-71320U-10,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7132
2.

国際会議録
国際会議録
2. Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement
Y. Gong ; B. Li
出版情報: Optical test and measurement technology and equipment.  3  pp.672356-1-672356-6,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6723
3.

国際会議録
国際会議録
3. Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down technique
Y. Gong ; Y. Han ; B. Li
出版情報: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  1  pp.72830U-1-72830U-6,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7283
4.

国際会議録
国際会議録
4. Photothermal detuning: a sensitive technique for absorption measurement of optical thin films
H. Hao ; B. Li ; M. Liu ; Y. Gong
出版情報: Laser-induced damage in optical materials : 2007 : 39th Annual Boulder Damage Symposium : proceedings : 24-26 September, 2007, Boulder, Colorado.  pp.67201D-1-67201D-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6720
5.

国際会議録
国際会議録
5. Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement
Y. Gong ; B. Li
出版情報: Laser-induced damage in optical materials : 2007 : 39th Annual Boulder Damage Symposium : proceedings : 24-26 September, 2007, Boulder, Colorado.  pp.67201E-1-67201E-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6720