Blank Cover Image

Investigation and Control of Chemical and Surface Chemical Effects During Dielectric CMP

著者名:
掲載資料名:
Advances in chemical-mechanical polishing : symposium held April 13-15, 2004, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
816
発行年:
2004
開始ページ:
283
終了ページ:
288
総ページ数:
6
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997660 [1558997660]
言語:
英語
請求記号:
M23500/816
資料種別:
国際会議録

類似資料:

Abiade, J.T., Yeruva, S., Moudgil, B., Kumar, D., Singh, R.K.

Materials Research Society

Salido,J.T., Dolan,J.M., Hampshire,J.B., Khosla,P.K.

SPIE-The International Society for Optical Engineering

Lee, S.-M., Abiade, J., Choi, W., Singh, R.

Electrochemical Society

Craciun, V., Bassim, N.D., Howard, J.M., Spear, J., Bates, S., Singh, R.K.

Materials Research Society

Choi, W., Lee, S.-M., Singh, R.

Electrochemical Society

Viatella, J., Singh, R.K.

Electrochemical Society

Choi, Wonseop, Lee, Seung-Mahn, Singh, Rajiv K.

Materials Research Society

Basim, G.B., Adler, J.J., Mahajan, U., Singh, R.K., Moudgil, B.M.

Electrochemical Society

Choi, K.S., Vacassy, R., Bassim, N., Singh, R.K.

Materials Research Society

Chen, B., Biunno, N., Singh, R.K., Narayan, J.

Materials Research Society

Choi, Wonseop, Lee, Seung-Mahn, Singh, Rajiv K.

Materials Research Society

George, S.M., Elam, J.W., Grubbs, R.K., Nelson, C.E.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12