Current developments in lens design and optical systems engineering : 2-4 August 2000, San Diego, USA. pp.288-296, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA. pp.142-151, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.721-724, 1998. Zuerich, Switzerland. Trans Tech Publications
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.745-748, 1998. Zuerich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.185-190, 1997. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.867-872, 1995. Zurich, Switzerland. Trans Tech Publications
Color imaging : device-independent color, color hard copy, and graphic arts II : 10-14 February 1997, San Jose, California. pp.65-75, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering