1.

国際会議録
国際会議録
1. Infrared spectroscopy analysis of porous silicon: a comparison of various preparation conditions
A.I. Belogorokhov ; L. Belogorokhova ; V.A. Karavanskii
出版情報: Second International Conference on Thin Film Physics and Applications : '94 TFPA : 15-17 April 1994, Shanghai, China.  pp.156-162,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2364
2.

国際会議録
国際会議録
2. Clustering and strain influence on the optical and vibrational properties of In0.53Ga0.47As/lnP epitaxial heterostructures
A.I. Belogorokhov ; E.V. Solov'eva ; M.G. Mil'vidskii ; A.N. Osipova
出版情報: Second International Conference on Thin Film Physics and Applications : '94 TFPA : 15-17 April 1994, Shanghai, China.  pp.381-387,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2364