1.

国際会議録
国際会議録
1. Bias-Temperature-Stress Response of Commercially-Available SiC Power MOSFETs
R. Green ; A. Lelis ; M. El ; D. Habersat
出版情報: Silicon Carbide and Related Materials 2014 : Selected peer reviewed papers from the European Conference on Silicon Carbide & Related Materials (ECSCRM 2014), September 21-25, 2014, Grenoble, France.  pp.677-680,  2015.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 821-823
2.

国際会議録
国際会議録
2. Radiation-Induced Trapped Charging Effects in SiC Power MOSFETs
R. Green ; A. Lelis ; D. Urciuoli ; M. Litz ; J. Carroll
出版情報: Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan.  pp.533-536,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 778-780