1.

国際会議録
国際会議録
1. Impact of Nitridation on Negative and Positive Charge Buildup in SiC Gate Oxides
J. Rozen ; S. Dhar ; S.W. Wang ; V.V. Afanas'ev ; S.T. Pantelides
出版情報: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.803-806,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 600-603
2.

国際会議録
国際会議録
2. Effect of NO Annealing on 6H- and 4H-SiC MOS Interface States
A.F. Basile ; J. Rozen ; X.D. Chen ; S. Dhar ; J.R. Williams
出版情報: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.499-502,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 645-648