Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.135-140, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA. pp.218-224, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Emerging lithographic technologies V : 27 February-1 March, 2001, Santa Clara, [California], USA. pp.126-137, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Emerging lithographic technologies V : 27 February-1 March, 2001, Santa Clara, [California], USA. pp.115-125, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Storage and retrieval for image and video databases VI : 28-30 January 1998, San Jose, California. pp.150-161, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California. Part 2 pp.1441-1451, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
18th Congress of the International Commission for Optics : Optics for the next millennium : 2-6 August, 1999, San Francisco, California. pp.213-214, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.180-183, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Charged particle optics IV : 22-23 July 1999, Denver, Colorado. pp.35-46, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Charged particle optics IV : 22-23 July 1999, Denver, Colorado. pp.65-74, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering