Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.82-84, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Color imaging : device-independent color, color hardcopy, and graphic arts III : 28-30 January 1998, San Jose, California. pp.207-218, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.86-89, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-Optic and second harmonic generation materials, devices, and applications. pp.174-179, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA. pp.52-60, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.267-270, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.271-275, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing 2001 : 24-26 January, 2001, San Jose, USA. pp.648-655, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Charged particle optics IV : 22-23 July 1999, Denver, Colorado. pp.2-6, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.22-26, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering