Integrated optics devices iv : 24-25 January, 2000, San Jose, California. pp.301-308, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.371-374, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.1097-1100, 1998. Zuerich, Switzerland. Trans Tech Publications
Electrochemical methods in corrosion research : proceedings of the 4th International Symposium, held in Espoo, Finland, July 1-4, 1991. pp.123-128, 1992. Aedemannsdorf, Switzerland. Trans Tech Publications
Electrochemical methods in corrosion research : proceedings of the 4th International Symposium, held in Espoo, Finland, July 1-4, 1991. pp.507-514, 1992. Aedemannsdorf, Switzerland. Trans Tech Publications
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.319-324, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.272-277, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.283-287, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.297-301, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering