Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58781G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Chen, M. ; Zhu, J. ; Ma, Y. ; Du, J. ; Guo, Y. ; Du, C.
出版情報:
ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.60320K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Du, J. ; Chen, M. ; Ma, Y. ; Zhu, J. ; Peng, Q. ; Guo, Y. ; Du, C.
出版情報:
Current developments in lens design and optical engineering VI : 2-4 August 2005, San Diego, California, USA. pp.58740S-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China. pp.642107-642107, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.970-973, 2006. Uetikon-Zuerich. Trans Tech Publications
Liquid chromatography/mass spectrometry MS/MS and time of flight MS : analysis of emerging contaminants. pp.161-174, 2003. Washington, D.C.. American Chemical Society
Xu, X.X. ; Lin, H.B. ; Wu, Z.C. ; Yu, G. ; Zhu, J. ; Zhang, C.Z. ; Zhang, G.Y.
出版情報:
Color science and imaging technologies : 16-17 October, 2002, Shanghai, China. pp.188-194, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.438-441, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China. pp.539-542, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering