1.

国際会議録
国際会議録
1. Grayscale optical correlator for real-time onboard ATR
Chao,T.-H. ; Zhou,H. ; Reyes,G.F.
出版情報: Optical pattern recognition XII : 19 April, 2001, Orlando, USA.  pp.10-15,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4387
2.

国際会議録
国際会議録
2. Compact holographic memory and its application to optical pattern recognition
Chao,T.-H. ; Reyes,G.F. ; Zhou,H.
出版情報: Optical pattern recognition XII : 19 April, 2001, Orlando, USA.  pp.60-67,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4387
3.

国際会議録
国際会議録
3. TuD25:High-density holographic memory and its applications to optical pattern recognition
Chao,T.-H. ; Zhou,H. ; Reyes,G.F.
出版情報: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.181-183,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3864
4.

国際会議録
国際会議録
4. Two practical ways to avoid spurious reflections from shiny surfaces on a 3D machine vision inspection system
Yang,D. ; Chen,J. ; Zhou,H. ; Buckley,S.
出版情報: Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California.  pp.30-33,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3652
5.

国際会議録
国際会議録
5. New algorithm to calculate the center of laser reflections
Yang,D. ; Chen,J. ; Zhou,H. ; Buckley,S.
出版情報: Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California.  pp.54-58,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3306
6.

国際会議録
国際会議録
6. New method of correlating product wafer yield to alignment performance and an optimized accounting method for product wafer alignment
Zhou,H.
出版情報: Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California.  pp.164-172,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3332
7.

国際会議録
国際会議録
7. Fabrication of self-supporting transmission gratings for plasma diagnostics
Xu,X. ; Hong,Y. ; Tian,Y. ; Huo,T. ; Zhou,H. ; Tao,X. ; Jiang,S. ; Fu,S.
出版情報: X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado.  pp.380-385,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3766
8.

国際会議録
国際会議録
8. Measurement of gravitational waves of the Earth with laser double-beam interference method
Wang,F. ; Zhou,H.
出版情報: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.289-291,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4220
9.

国際会議録
国際会議録
9. Liquid crystal sensor
Zhou,H. ; Wang,F.
出版情報: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.285-288,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4220
10.

国際会議録
国際会議録
10. Practical filter dynamic range compression for grayscale optical correlator using bipolar-amplitude SLM
Zhou,H. ; Chao,T.-H. ; Reyes,G.F.
出版情報: Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida.  pp.90-93,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4043