1.

国際会議録
国際会議録
1. Evaluating optical and supersmooth surface using AFM in optical maunfacturing technology
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhao,A.
出版情報: Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA.  pp.59-64,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4099
2.

国際会議録
国際会議録
2. Evaluation of an optical surface using nanometrology in optical manufacturing technology
Li,J. ; Zhao,A. ; Li,X. ; Zhang,X. ; Wang,M.
出版情報: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.566-568,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4231
3.

国際会議録
国際会議録
3. Evaluation of optical supersmooth surface using AFM and comparison to interference method
Li,J. ; Li,D. ; Zhang,X. ; Li,X. ; Zhao,A.
出版情報: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.336-344,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3557
4.

国際会議録
国際会議録
4. Testing method on nanometer-grade true microprofile of optical surface (Invited Paper)
Li,J. ; Li,X. ; Ying,A. ; Xiao,S. ; Wang,M. ; Zhao,A.
出版情報: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.276-281,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3557
5.

国際会議録
国際会議録
5. Laser processing device and technology used in instrument and meter industry
Zhang,G. ; Cui,M. ; Zhao,X. ; Zhao,A. ; Wang,S.
出版情報: Laser Processing of Materials and Industrial Applications.  pp.371-374,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2888
6.

国際会議録
国際会議録
6. Inspecting the microprofile and defects of optical surfaces using an atomic-force microscope
Li,J. ; Xiao,S. ; Zhao,A. ; Li,D.
出版情報: Input/Output and Imaging Technologies.  pp.270-273,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3422