1.

国際会議録
国際会議録
1. Chromaticity difference-based classification algorithm for imaging spectrometer data
Zhang,L. ; Lin,H. ; Li,D.
出版情報: Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China.  pp.165-170,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4554
2.

国際会議録
国際会議録
2. Microstructuring irradiated by 197- and 308-nm excimer laser
Lou,Q. ; Zhang,L.
出版情報: Lithography for semiconductor manufacturing II : 30 May-1 June, 2001, Edinburgh, UK.  pp.343-346,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4404
3.

国際会議録
国際会議録
3. Laser cleaning technology and its application
Song,W.D. ; Hong,M.H. ; Zhang,L. ; Lu,Y.F. ; Chong,T.C.
出版情報: Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore.  pp.280-283,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4426
4.

国際会議録
国際会議録
4. Structural formation of the lead zirconate titanate formed in pulsed-laser ablation deposition
Ichiki,M. ; Zhang,L. ; Wang,Z. ; Morikawa,Y. ; Tanaka,M. ; Maeda,R.
出版情報: Complex mediums II : beyond linear isotropic dielectrics, 30 July-1 August, 2001, San Diego, USA.  pp.387-394,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4467
5.

国際会議録
国際会議録
5. Ultrathin silicon (UTSiR) on insulator CMOS transceiver and time-division multiplexed switch chips for smart pixel integration
Zhang,L. ; Sawchuk,A.A.
出版情報: Wave optics and VLSI photonic devices for information processing : 2-3 August 2001 San Diego, USA.  pp.214-219,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4435
6.

国際会議録
国際会議録
6. Spatial correlation thresholding-based edge-preserving image restoration
Bao,P. ; Zhang,L.
出版情報: Image and signal processing for remote sensing VII : 18-21 September 2001, Toulouse, France.  pp.328-339,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4541
7.

国際会議録
国際会議録
7. Microscanner actuated by double PZT thin film
Zhang,L. ; Lin,W.-M. ; Maeda,R.
出版情報: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  pp.528-534,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4408
8.

国際会議録
国際会議録
8. Image retrieval by using subpiece accumulative histogram
Zhang,L. ; Ke,X. ; Shu,H.
出版情報: Image compression and encryption technologies : 22-24 October 2001, Wuhan, China.  pp.149-153,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4551
9.

国際会議録
国際会議録
9. Investigation on bridge in QFP and fatigue in BGA based on simulating solder joint formation
Zhao,X. ; Wang,C. ; Zhang,L. ; Yin,C. ; Yang,S.
出版情報: Intelligent systems in design and manufacturing.  pp.222-227,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4192
10.

国際会議録
国際会議録
10. Particle-enhanced near-field optical effect and laser writing for nanostructure fabrication
Lu,Y.F. ; Zhang,L. ; Son,W.D. ; Zheng,Y.W. ; Luk'yanchuk,B.S.
出版情報: Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore.  pp.143-145,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4426