1.

国際会議録
国際会議録
1. Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions [6337-24]
Meneghini,M. ; Trevisanello, L. ; Podda, S. ; Buso, S. ; Spiazzi, G. ; Meneghesso, G. ; Zanoni, E.
出版情報: Sixth international conference on solid state lighting : 14-17 August 2006, San Diego, California, USA.  pp.63370R-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6337
2.

国際会議録
国際会議録
2. Temperature Stability of Breakdown Voltage on SiC Power Schottky Diodes with Different Barrier Heights
Pierobon, R. ; Meneghesso, G. ; Zanoni, E. ; Roccaforte, F. ; Via, F. La ; Raineri, V.
出版情報: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.933-936,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 483-485
3.

国際会議録
国際会議録
3. Reliability Issues due to Hot-Electron Effects in GaAs-Based MESFET's and HEMT's
Zanoni, E. ; Tedesco, C. ; Neviani, A. ; Meneghesso, G.
出版情報: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.111-124,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-1
4.

国際会議録
国際会議録
4. Electrical Characterization of Inhomogeneous Ni2/Si/SiC Schottky Contacts
Roccaforte, F. ; La Via, F. ; Raineri, V. ; Pierobon, R. ; Zanoni, E.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.869-872,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460
5.

国際会議録
国際会議録
5. Study of short-term instabilities of InGaN/GaN Light-emitting diodes by means of capacitance-voltage measurements and deep-level transient spectroscopy
Meneghesso, G. ; Meneghini, M. ; Levada, S. ; Zanoni, E. ; Cavallini, A. D. M. ; Castaldini, A. ; Hdrle, V. ; Zahner, T. ; Zehnder, U.
出版情報: Fourth international conference on solid state lighting : 3-6 August 2004, Denver, Colorado, USA.  pp.251-259,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5530