1.

国際会議録
国際会議録
1. Cognitive issues in searching images with visual queries
Yu,B. ; Evens,M.W.
出版情報: Advances in computer-assisted recognition : 27th AIPR Workshop : 14-16 October, 1998, Washington, D.C..  pp.162-173,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3584
2.

国際会議録
国際会議録
2. Applications of two-photon fluorescence microscopy in deep-tissue imaging
Dong,C.Y. ; Yu,B. ; Hsu,L. ; Kaplan,P.D. ; Blankschstein,D. ; Langer,R. ; So,P.T.C.
出版情報: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.105-114,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4082
3.

国際会議録
国際会議録
3. Application of two-photon microscopy to elucidate oleic-acid-induced changes in microscale transdermal transport processes
Yu,B. ; Dong,C.-Y. ; So,P.T.C. ; Blankschtein,D. ; Langer,R.
出版情報: Multiphoton microscopy in the biomedical sciences, 21-23 January, 2001, San Jose, USA.  pp.217-230,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4262
4.

国際会議録
国際会議録
4. Low-temperature preparation of diamondlike carbon film protective coationgs for superconducting films
Yu,B. ; Liu,X. ; Chen,Y. ; Sho,R.
出版情報: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.328-330,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3175
5.

国際会議録
国際会議録
5. High-k scaling for gate insulators: an insightful study
Krishnan,S. ; Yeap,G.C.-F. ; Yu,B. ; Xiang,Q. ; Lin,M.-R.
出版情報: Microelectronic device technology II : 23-24 September, 1998, Santa Clara, California.  pp.65-72,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3506
6.

国際会議録
国際会議録
6. Easily performed method of solar total irradiance measurement in space
Fang,W. ; Yu,B.
出版情報: Optical remote sensing of the atmosphere and clouds : 15-17 September 1998, Beijing, China.  pp.469-474,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3501
7.

国際会議録
国際会議録
7. Phase transition and frequency doubling of β-BaB2O4 and K3Li12-xNb5+xO15+2x crystals
Yu,B. ; Yu,T. ; Jiang,G. ; You,J.
出版情報: Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA.  pp.210-216,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4098
8.

国際会議録
国際会議録
8. On-orbit radiance correction for ocean-color CCD imager
Zheng,Y. ; Cui,D. ; Yu,B.
出版情報: Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China.  pp.55-59,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3505
9.

国際会議録
国際会議録
9. Research on the applications of miniature optical pattern recognition system
Wang,R. ; Hua,T.J. ; Qin,W. ; Chen,G. ; Fu,Y. ; Guo,Q. ; Wang,J. ; Yu,B. ; Zhu,Z. ; Ruan,Z.
出版情報: Optical Pattern Recognition VII.  pp.173-181,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2752
10.

国際会議録
国際会議録
10. Effects of indium implant and post-RTA on performance and reliability of sub-100-nm retrograde channel NMOSFETs
Xiang,Q. ; Yu,B. ; Yeap,G.C.-F. ; Lin,M.-R.
出版情報: Microelectronic Device Technology III.  pp.186-194,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3881