1.

国際会議録
国際会議録
1. High power diode-end-pumped intracavity frequency-doubled Nd:GdVO4/LBO red laser [6028-13]
Du, C. ; Ruan, S. ; Yu, Y. ; Zeng, F.
出版情報: ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China.  pp.60280D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6028
2.

国際会議録
国際会議録
2. DEPLETION FRACTION OF SILANE AND DOMINANT NEUTRAL RADICAL IN RF GLOW DISCHARGE IN SILANE
Lin, Q. ; Lin, X. ; Xu, Z. ; Yu, Y. ; Peng, S.
出版情報: Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A..  pp.37-42,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 297
3.

国際会議録
国際会議録
3. High-speed travelling-wave electro-absorption modulators (Invited Paper) [6350-04]
Westergren, U. ; Yu, Y. ; Thylen, L.
出版情報: Workshop on optical components for broadband communication : 28-29 June 2006, Stockholm, Sweden.  pp.635004-635004,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6350
4.

国際会議録
国際会議録
4. Plasma Enhanced Chemical Vapor Deposition of Silicon Dioxide and Nitride Films Using the Enviromnentally Benign Precursor Diethylsilane
Chen, L. ; Levy, R.A. ; Grow, J.M. ; Yu, Y.
出版情報: Proceedings of the Thirteenth International Symposium on Chemical Vapor Deposition.  pp.510-515,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-5
5.

国際会議録
国際会議録
5. Feasibility of improving CD-SEM-based APC system for exposure tool by spectroscopic-ellipsometry-based APC system
Lin, W. ; Liao, S. ; Tsai, R. ; Yeh, M. ; Hsieh, C. ; Yu, Y. ; Lin, B. S. ; Fu, S. ; Dziura, T. G.
出版情報: Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA.  pp.138-144,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5755
6.

国際会議録
国際会議録
6. Multi-modal iterative adaptive processing (MIAP) performance in the discrimination mode for landmine detection
Yu, Y. ; Collins, L. M.
出版情報: Detection and remediation technologies for mines and minelike targets X : 28 March-1 April, 2005, Orlando, Florida, USA.  pp.1108-1117,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5794
7.

国際会議録
国際会議録
7. Study on the stress of silicon nitride thin films prepared by PECVD
Yu, Y. ; Luo, Z. ; Weng, X.
出版情報: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.212-215,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5774
8.

国際会議録
国際会議録
8. Landmine discrimination via Bayesian adaptive multimodal processing: results for handheld and vehicular sensors
Yu, Y. ; Torrione, P.A. ; Collins, L.M.
出版情報: Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA.  pp.791-798,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5415
9.

国際会議録
国際会議録
9. HfO2 Thin Films Deposited On SOT by Ion Beam Enhanced Deposition
Tao, K. ; Yu, Y.
出版情報: Dielectrics in emerging technologies : proceedings of the international symposium.  pp.367-373,  2003.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2003-1
10.

国際会議録
国際会議録
10. Information reconstruction based on phase-shifting technique in digital holography
Jiao, Y. ; Yu, Y. ; Lu, Z.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.371-379,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5188