1.

国際会議録
国際会議録
1. Compact standing-wave Fourier-transform interferometer with harmonic spectral analysis [6079-72]
Fu. J. ; Yu, X. ; Zhang, B. ; Harris, J. S.
出版情報: Coherence domain optical methods and optical coherence tomography in biomedicine X : 23-25 January 2006, San Jose, California, USA.  pp.60791O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6079
2.

国際会議録
国際会議録
2. PHOTOEMISSION CHARACTERIZATION OF THIN FILM NUCLEATION ON INERT SUBSTRATES
Haugstad, G. ; Raisanen, A. ; Caprile, C. ; Yu, X. ; Franciosi, A.
出版情報: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.51-56,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 159
3.

国際会議録
国際会議録
3. Remote sensing image fusion based on frequency domain segmenting 16419-72]
Li, D. ; Li, L. ; Yu, X.
出版情報: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.641921-641921,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6419
4.

国際会議録
国際会議録
4. Texture classification of aerial image using Bayesian networks [641 9-50]
Yu, X. ; Zheng, Z. ; Li, L. ; Cai, L.
出版情報: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.64191E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6419
5.

国際会議録
国際会議録
5. Research on key technologies for data-interoperability-based metadata, data compression and encryption, and their application [6421-12]
Yu, X. ; Shao, Q. ; Zhu, Y. ; Deng, Y. ; Yang, H.
出版情報: Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China.  pp.64210D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6421
6.

国際会議録
国際会議録
6. Mini-adaptive optics system and its experiments
Hu, X.Q. ; Yu, X. ; Zhao, D.Z. ; Cao, G.R. ; Wang, S. ; Hu, W.J. ; Jiang, W.J.
出版情報: Adaptive optics and and applications II : 15-16 October 2002 Shanghai, China.  pp.7-12,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4926
7.

国際会議録
国際会議録
7. Signal processing of the Shack- Hartmann wavefront sensor operated with extended targets
Hu, X. ; Zhao, D. ; Yu, X. ; Shi, H.
出版情報: Adaptive optics and and applications III : 8-9 November 2004, Beijing, China.  pp.78-82,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5639
8.

国際会議録
国際会議録
8. Post-treating techniques of porous silicon thin film
Zhu, Z. ; Long, Y. ; Chen, S. ; Yu, X. ; Zhu, J.
出版情報: Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China.  pp.438-441,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5774
9.

国際会議録
国際会議録
9. Balanced classifiers and their fusion
Yu, X. ; Kober, W. ; Scharf, L.
出版情報: Automatic target recognition XV : 29-31 March 2005, Orlando, Florida, USA.  pp.241-248,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5807
10.

国際会議録
国際会議録
10. Influences of extinction ratio and bias-angle error of polarizers on the performance of an optical current sensor
Wang, Z.P. ; Li, Q.B. ; Feng, R.Y. ; Wang, H.L. ; Huang, Z.J. ; Yu, X. ; Shi, J.H.
出版情報: Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China.  pp.392-399,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4920