1.

国際会議録
国際会議録
1. Recent Developments In Ultrathin Oxynitride And Oxide/Nitride Stacked Films Prepared By In-Situ RTP Multiprocessing
Bhat, M. ; Yoon, G.W. ; Kim, J. ; Han, L,K. ; Yan, J. ; Wristers, D. ; Kwong, D.L.
出版情報: Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.317-327,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-16
2.

国際会議録
国際会議録
2. Process Dependence of MOSFET Performance and Reliability with N2O-Based Furnace-Grown Gate Oxides
Han, L.K ; Wang, H.H. ; Yoon, G.W. ; Allman, D. ; Kwong, D.L.
出版情報: ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology.  pp.495-503,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-5
3.

国際会議録
国際会議録
3. N2O-Based Gate Dielectrics for ULSI Applications
Kim, J. ; Yoon, G.W. ; Lo, G.Q. ; Ahn, J. ; Kwong, D.L.
出版情報: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.25-35,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-1
4.

国際会議録
国際会議録
4. Biophoton emission from the right and left hands
Choi, C.H. ; Jung, H.-H. ; Woo, W.M. ; Soh, K.-S. ; Yoon, G.W.
出版情報: Optics in Health Care and Biomedical Optics: Diagnostics and Treatment.  pp.423-428,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4916
5.

国際会議録
国際会議録
5. Multiple diagnosis based on photoplethysmography: hematocrit, SpO2, pulse, and respiration (Invited Paper)
Yoon, G.W. ; Lee, J.Y. ; Jeon, K.J. ; Park, K.K. ; Yeo, H.S. ; Hwang, H.T. ; Kim, H.S. ; Hwang, I.D.
出版情報: Optics in Health Care and Biomedical Optics: Diagnostics and Treatment.  pp.185-188,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4916