1.

国際会議録
国際会議録
1. ORIGIN OF SURFACE DEFECTS IN a-Si:H FILMS
Yan, H. ; Morimoto, A. ; Kumeda, M. ; Shimizu, T. ; Yonezawa, Y.
出版情報: Amorphous silicon technology, 1992.  pp.247-252,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 258
2.

国際会議録
国際会議録
2. An ambulatory recording system for the assessment of autonomic changes across multiple days
Sollers III, J. J. ; Yonezawa, Y. ; Silver, R. A. ; Merritt, M. M. ; Thayer, J. F.
出版情報: Biomonitoring for physiological and cognitive performance during military operations : 31 March-1 April 2005, Orlando, Florida, USA.  pp.56-62,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5797
3.

国際会議録
国際会議録
3. High-Throughput Screening of Flux Materials for Single Crystal Growth by Combinatorial Pulsed Laser Deposition
Takahashi, R. ; Tanigawa, T. ; Yamamoto, Y. ; Yonezawa, Y. ; Matsumoto, Y. ; Koinuma, H.
出版情報: Combinatorial and artificial intelligence methods in materials science II : symposium held December 1-4, Boston, Massachusetts, U.S.A.  pp.69-74,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 804