1.

国際会議録
国際会議録
1. Varied-line-spacing laminar-type holographic grating for the standard soft-x-ray flat-field spectrograph
Koike,M. ; Namioka,T. ; Gullikson,E.M. ; Harada,Y. ; Ishikawa,S. ; Imazono,T. ; Mrowka,S. ; Miyata,N. ; Yanagihara,M. ; Underwood,J.H. ; Sano,K. ; Ogiwara,T. ; Yoda,O. ; Nagai,S.
出版情報: Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA.  pp.163-170,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4146
2.

国際会議録
国際会議録
2. Formation of Oxygen Clusters in Quenched Cz- and MCz-Si Crystals
Ikari,A. ; Haga,H. ; Yoda,O. ; Uedono,A. ; Ujihira,Y.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.225-230,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
3.

国際会議録
国際会議録
3. Oxygen Microclusters in Quenched Si Studied by Positron Annihilation
Uedono,A. ; Ujihira,Y. ; Ikari,A. ; Yoda,O.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.1301-1304,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110