1.

国際会議録
国際会議録
1. Measurement of roughness of optical surface by focal plane CCD camera
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
出版情報: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.84-87,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3275
2.

国際会議録
国際会議録
2. New subjective evaluation on optical image quality
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
出版情報: New image processing techniques and applications : algorithms, methods, and components II : 18-19 June 1997, Munich, FRG.  pp.156-160,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3101
3.

国際会議録
国際会議録
3. Frequency analysis for roughness of optical surface by focal plane CCD camera
Li,J. ; Ying,A. ; Li,X. ; Zhang,X. ; Zao,A.
出版情報: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.396-399,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3100
4.

国際会議録
国際会議録
4. Testing method for microprofile of optical supersmooth surface
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhang,X. ; Zhuo,A.
出版情報: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.398-403,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3897
5.

国際会議録
国際会議録
5. Evaluating optical and supersmooth surface using AFM in optical maunfacturing technology
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhao,A.
出版情報: Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA.  pp.59-64,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4099
6.

国際会議録
国際会議録
6. High-speed computer color testing and matching system online
Li,J. ; Zao,A. ; Lei,C. ; Chan,X. ; Li,X. ; Zhang,X. ; Ying,A. ; Wan,X.
出版情報: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.75-78,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2899
7.

国際会議録
国際会議録
7. Testing method on nanometer-grade true microprofile of optical surface (Invited Paper)
Li,J. ; Li,X. ; Ying,A. ; Xiao,S. ; Wang,M. ; Zhao,A.
出版情報: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.276-281,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3557