1.

国際会議録
国際会議録
1. Meeting critical gate Iinewidth control needs at the 65 nm node [6156-23]
Mahorowala, A. ; Halle, S. ; Gabor, A. ; Chu, W. ; Barberet, A. ; Samuels, D. ; Abdo, A. ; Tsou, L. ; Yan, W. ; Iseda, S. ; Patel K ; Dirahoui, B ; Nomura, A ; Ahsan, I ; Azam, F ; Berg, G ; Brendler, A ; Zimmerman, J ; Faure, T
出版情報: Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA.  pp.61560M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6156
2.

国際会議録
国際会議録
2. Defect classification of highly noisy NDE data using classifier ensembles [6167-60]
Goebel, K. F. ; Yan, W. ; Eklund, N. H. W. ; Hu, X. ; Avasarala, V. ; Celaya, J.
出版情報: Smart structures and materials 2006 : Smart sensor monitoring systems and applications : 27 February-1 March 2006, San Diego, California, USA.  pp.61671O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6167
3.

国際会議録
国際会議録
3. Development of an incremental structural parameter model for predicting reactive ion etch rates of 193-nm photoresist polymer platforms
Wallow, T. I. ; Brock, P. J. ; DiPietro, R. A. ; Allen, R. D. ; Opitz, J. ; Sooriyakumaran, R. ; Hofer, D. C. ; Mewherter, A. M. ; Cui, Y. ; Yan, W. ; Worth, G. ; Moreau, W. M. ; Meute, J. ; Byers, J. D. ; Rich, G. K. ; McCallum, M. ; Jayaraman, S. ; Vicari, R. ; Cagle, J. ; Sun, S. ; Hullihen, K. A.
出版情報: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.26-35,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3678
4.

国際会議録
国際会議録
4. Reactive ion etch studies of DUV resists
Kwong, R. W. ; Moreau, W. M. ; Yan, W.
出版情報: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.1209-1214,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3678
5.

国際会議録
国際会議録
5. Study on improving the surface hardness of TiAl alloy by laser nitriding in on atmospheric ambient [6028-58]
Yang, Y. ; Liu, C. ; Yan, W. ; Zhang, D.
出版情報: ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China.  pp.60281M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6028
6.

国際会議録
国際会議録
6. EasyPanorama: a new panorama authoring system
Fang, X. ; Yan, W. ; Pan, Z. ; Xu, D. ; Chen, M.
出版情報: Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China.  pp.111-116,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5444
7.

国際会議録
国際会議録
7. Stability of Advanced Photoresist Systems for Sub-0.25 Micron Lithography during Reactive Ion Etch Processes
Naeem, M.D. ; Yan, W. ; Zhu, J.
出版情報: Plasma etching processes for sub-quarter micron devices : proceedings of the international symposium.  pp.322-327,  1999.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-30
8.

国際会議録
国際会議録
8. Modulation of Two Second Messengers in Bitter Taste Transduction of Agriculturally Relevant Compounds
Spielman, A.I. ; Yan, W. ; Krizhanovsky, V. ; Rosenzweig, S. ; Yamamoto, T. ; Naim, M.
出版情報: Chemistry of taste : mechanisms, behaviors, and mimics.  pp.18-31,  2002.  Washington, D.C..  American Chemical Society
シリーズ名: ACS symposium series
シリーズ巻号: 825
9.

国際会議録
国際会議録
9. Classifier performance measures in multifault diagnosis for aircraft engines
Yan, W. ; Goebel, K. ; Li, J.C.
出版情報: Component and systems diagnostics, prognostics, and health management II : 3-4 April, 2002, Orlando, USA.  pp.88-97,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4733
10.

国際会議録
国際会議録
10. The Charpy Impact Behavior of Fe3Al and Fe3Al-20 at.% Mn Alloys
Liu, J. N. ; Yan, W. ; Ma, J. L. ; Wu, K. H.
出版情報: High-Temperature ordered intermetallic alloys VII : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.343-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 460