Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan. pp.373-382, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan. pp.400-409, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.280-292, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Stereoscopic displays and virtual reality systems V : 26-29 January 1998, San Jose, California. pp.278-285, 1998. Bellingham, WA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Exploiting new image sources and sensors : 26th AIPR Workshop, 15-17 October 1997, Washington, D.C.. pp.29-35, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
23rd International Congress on High-Speed Photography and Photonics : 20-25 September, 1998, Moscow, Russia. Part1 pp.46-55, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Ultrafast phenomena in semiconductors III : 27-29 January, 1999, San Jose, California. pp.208-215, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
24th International Congress on High-Speed Photography and Photonics : 24-29 September 2000, Sendai, Japan. pp.365-372, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering