Human vision and electronic imaging VII : 21-24 January 2002, San Jose, USA. pp.448-454, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Data mining and knowledge discovery : theory, tools, and technology IV : 1-4 April 2001, Orlando, [Florida] USA. pp.319-323, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical applications of micro- and nanoengineering II : 13-15 December 2004, Sydney, Australia. pp.254-264, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.34-41, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Flat-panel displays and sensors - principles, materials and processes : symposium held April 4-9, 1999, San Francisco, California, U.S.A.. pp.507-512, 2000. Pittsburgh, Pa.. Materials Research Society
Biomedical applications of micro- and nanoengineering II : 13-15 December 2004, Sydney, Australia. pp.363-370, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Cameron, J. F. ; Ablaza, S. L. ; Xu, G. ; Yueh, W.
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.785-799, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.800-809, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Gong, H. ; Xu, G. ; Zhu, S. ; Qui, H. ; Li, X. ; Liu, D. ; Zhu, L. ; Lin, X. ; Zhang, Y. ; Fang, J.
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Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.59640B-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Xie, M. ; Yang, X. ; Chen, W. ; Tao, L. ; Wang, X. ; Xu, G. ; Wang, L. ; Xu, Y. -D. ; Liu, S. ; Guo, X. -X.
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