1.

国際会議録
国際会議録
1. Characterization of modulation-doped n-AlxGa1-xAs/GaAs heterostructure using spectroscopic ellipsometry and photoreflectance
Wong,C.C. ; Mochizuki,M. ; Yaguchi,H. ; Saitoh,T. ; Xiong,Y.-M.
出版情報: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.226-229,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2873
2.

国際会議録
国際会議録
2. Optical properties of ion-implanted laser-annealed Si studied by spectroscopic ellipsometry
Asai,K. ; Watanabe,K. ; Sameshima,T. ; Saitoh,T. ; Xiong,Y.-M.
出版情報: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.258-261,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2873
3.

国際会議録
国際会議録
3. Characterization of Sio-doped GaAs using photoellipsometry and photoreflectance
Mochizuki,M. ; Kobayashi,K. ; Yaguchi,H. ; Saitoh,T. ; Xiong,Y.-M.
出版情報: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.270-273,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2873
4.

国際会議録
国際会議録
4. Investigation of anisotropic effect on the optical properties of InxGa1-xP using spectroscopic ellipsometry
Watanabe,K. ; Saitoh,T. ; Xiong,Y.-M.
出版情報: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.266-269,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2873
5.

国際会議録
国際会議録
5. Optical properties of sol-gel Ba0.7Sr0.3TiO3 thin films studied by spectroscopic ellipsometry
Suzuki,I. ; Miyazaki,M. ; Saitoh,T. ; Xiong,Y.-M.
出版情報: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.262-265,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2873