1.

国際会議録
国際会議録
1. Effects of Hydrogen Annealing Process Conditions on Nano Scale Silicon (011) Fins
Zaman, Rownak J. ; Xiong, Weize ; Quintanilla, Rudy ; Schulz, Thomas ; Cleavelin, C. Rinn ; Wise, Rick ; Pas, Mike ; Patruno, Paul ; Schruefer, Klaus ; Banerjee, Sanjay K.
出版情報: Micro- and nanosystems - materials and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.37-42,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 872
2.

国際会議録
国際会議録
2. Fin Sidewall Microroughness Measurement by AFM
Gondran, Carolyn F.H. ; Morales, Emily ; Guerry, Angela ; Xiong, Weize ; Cleavelin, C.Rinn ; Wise, Rick ; Balasubramanian, Sriram ; King, Tsu-Jae
出版情報: Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.365-372,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 811