1.

国際会議録
国際会議録
1. Prediction of blood glucose using interstitial fluid extracted by ultrasound and vacuum
Progress in biomedical optics and imaging. vol.8, no.22
出版情報: Optical diagnostics and sensing VII : 23-24 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6445
2.

国際会議録
国際会議録
2. High-resolution surface plasmon resonance biosensing system for glucose concentration detecting
Progress in biomedical optics and imaging. vol.8, no.22
出版情報: Optical diagnostics and sensing VII : 23-24 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6445
3.

国際会議録
国際会議録
3. Scanning white-light interferometry for microstructures geometrical characterization
T. Guo ; C. Hu ; J. Chen ; X. Fu ; X. Hu
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63573O-1-63573O-7,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
4.

国際会議録
国際会議録
4. Nanoscale measurement technique of in-plane motion for MEMS based on phase correlation method
Z. Chen ; X. Hu ; C. Jin ; I. Lan
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63573P-1-63573P-6,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
5.

国際会議録
国際会議録
5. Automatic interpretation and precision detecting of target's axis in image sequences
X. Hu ; Y. Xue ; S. Zhang ; X. Liu
出版情報: 27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China.  pp.62793R-1-62793R-7,  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6279
6.

国際会議録
国際会議録
6. The Complete (3-D) Co-Seismic Displacements Using Point-Like Targets Offset Tracking with Ascending and Descending SAR Data
X. Hu ; T. Wang ; M. Liao
出版情報: Proceedings of ESA Living Planet Symposium 9 - 13 September 2013, Edinburgh, UK.  2013.  Noordwijk.  ESA Communications
シリーズ名: ESA SP
シリーズ巻号: 722
7.

国際会議録
国際会議録
7. Electrochemical Preparation of Alternate Pt-Fe Alloy Nanowires with AAO Templates
D. Yuan ; X. Hu ; J. Chen ; C. Yang
出版情報: Nanoporous Materials: Chemistry and Applications.  pp.35-39,  2007.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 6(11)
8.

国際会議録
国際会議録
8. The solutions to two technical problems in digital land use mapping
X. Hu ; G. Niu ; W. An
出版情報: Geoinformatics 2007, Cartographic theory and models : 25-27 May 2007, Nanjing, China.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6751
9.

国際会議録
国際会議録
9. Application of miniature interferometers in nanomeasuring and positioning technology
J. Chen ; T. Guo ; X. Fu ; X. Hu
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63574A-1-63574A-4,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
10.

国際会議録
国際会議録
10. Study on recognition technology of complementary image
C. Liu ; X. Hu ; Y. Jian ; L. Zhang
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.635705-1-635705-6,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357