1.

国際会議録
国際会議録
1. Gate Stack Formation Using a Fully Integrated Single Wafer Cluster Tool
Frystak, David C. ; Kuehne, John ; Wise, Rick ; Fowler, Burt ; Grothe, Phil ; Barnett, Joel ; Miner, Gary
出版情報: Rapid thermal and integrated processing VI : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.221-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 470
2.

国際会議録
国際会議録
2. Facet Free Selective Silicon Epitaxy by Rapid Thermal Chemical Vapor Deposition
Violette, Katherine E. ; Wise, Rick ; Chao, Chih-Ping ; Unnikrishnan, Sreenath
出版情報: Rapid thermal and integrated processing VII : symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.289-,  1998.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 525
3.

国際会議録
国際会議録
3. Effects of Hydrogen Annealing Process Conditions on Nano Scale Silicon (011) Fins
Zaman, Rownak J. ; Xiong, Weize ; Quintanilla, Rudy ; Schulz, Thomas ; Cleavelin, C. Rinn ; Wise, Rick ; Pas, Mike ; Patruno, Paul ; Schruefer, Klaus ; Banerjee, Sanjay K.
出版情報: Micro- and nanosystems - materials and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.37-42,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 872
4.

国際会議録
国際会議録
4. Fin Sidewall Microroughness Measurement by AFM
Gondran, Carolyn F.H. ; Morales, Emily ; Guerry, Angela ; Xiong, Weize ; Cleavelin, C.Rinn ; Wise, Rick ; Balasubramanian, Sriram ; King, Tsu-Jae
出版情報: Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.365-372,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 811