1.

国際会議録
国際会議録
1. Epitaxial growth of Yb2O3 buffer layers on biaxially textured-Ni(100) substrates by Sol-Gel process
Chirayil, T. G. ; Paranthaman, M. ; Beach, D. B. ; Morrell, J. S. ; Sun, E. Y. ; Goyal, A. ; Williams, R. K. ; Lee, D. F. ; Martin, P. M. ; Kroeger, D. M. ; Freenstra, R. ; Verebelyi, D. T. ; Christen, D. K.
出版情報: Multicomponent oxide films for electronics : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.51-,  1999.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 574
2.

国際会議録
国際会議録
2. Filled Skutterudite Antimonides: Validation of the Electron-Crystal Phonon-Glass Approach to New Thermoelectric Materials
Mandrus, D. ; Sales, B. C. ; Keppens, V. ; Chakoumakos, B. C. ; Dai, P. ; Boatner, L. A. ; Williams, R. K. ; Thompson, J. R. ; Darling, T. W. ; Migliori, A. ; Maple, M. B. ; Gajewski, D. A. ; Freeman, E. J.
出版情報: Thermoelectric materials - new directions and approaches : symposium held March 31-April 3, 1997, San Francisco, California, USA.  pp.199-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 478
3.

国際会議録
国際会議録
3. MICROSTRUCTURAL CHARACTERIZATION OF IRON IMPLANTED SAPPHIRE NANOCOMPOSITES
Ren, Shelly X. ; McHargue, Carl J. ; Allard, L. F. ; Chen, Y. ; Hunn, J. D. ; Lucas, B. N. ; Williams, R. K.
出版情報: Microstructure of irradiated materials : Symposium held November 29-1 December, 1994, Boston, Massachusetts USA.  pp.305-,  1995.  Pittsburgh, Pa.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 373
4.

国際会議録
国際会議録
4. Development of a Reactive Extrusion Process for the Production of Plasticized Film Grade Polylactic Acid
Williams, R. K. ; Koenig, S. R.
出版情報: ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida.  pp.1922-1926,  2000.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 46