1.

国際会議録
国際会議録
1. Intrinsic Defects in High Purity Semi-Insulating 6H SiC
D. V. Savchenko ; E. N. Kalabukhova ; S. N. Lukin ; Tangali S. Sudarshan ; Yuri I. Khlebnikov ; William C. Mitchel ; S. Greulich-Weber
出版情報: Silicon carbide 2006--materials, processing and devices : symposium held April 18-20, 2006, San Francisco, California, U.S.A..  pp.219-224,  2006.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 911
2.

国際会議録
国際会議録
2. Electrical Measurement of the Vanadium Acceptor Level in 4H- and 6H-SiC
William C. Mitchel ; William D. Mitchell ; H. E. Smith ; M. E. Zvanut ; Wonwoo Lee
出版情報: Silicon carbide 2006--materials, processing and devices : symposium held April 18-20, 2006, San Francisco, California, U.S.A..  pp.225-230,  2006.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 911
3.

国際会議録
国際会議録
3. Virtual Fabrication of Electronic Nanomaterials of Prescribed Physical Properties
Liudmila A. Pozhar ; Alan T. Yeates ; Frank Szmulowicz ; William C. Mitchel
出版情報: Nanotechnology Topical Conference : 2003 AIChE Annual Meeting, San Francisco, California, November 16-21, 2003.  pp.134c-,  2003.  New York.  American Institute of Chemical Engineers
シリーズ名: AIChE Conference Proceedings
シリーズ巻号: P-201(TC)
4.

国際会議録
国際会議録
4. Virtual Fabrication of Electronic Nanomaterials of Prescribed Physical Properties
Liudmila A. Pozhar ; Alan T. Yeates ; Frank Szmulowicz ; William C. Mitchel
出版情報: 03 AIChE annlual meeting, November 16-21, San Francisco, California, AIChE 2003 annual meeting conference proceedings.  pp.134c-,  2003.  New York.  American Institute of Chemical Engineers
シリーズ名: AIChE Conference Proceedings
シリーズ巻号: P-201